KLA Instruments™ : Quotes, Address, Contact – AZoSensors
KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop tools and the Fabs group of automated systems. The KLA Instruments family includes the Alpha-Step®, Tencor™ and HRP® stylus profilers, the Zeta™ and Filmetrics® optical profilers and 3D microscopes, the Filmetrics thin-film metrology and Filmetrics R50 sheet resistance measurement tools, the Candela® defect inspection systems, and nanoindentation systems originally designed by Nanomechanics, Inc. and Keysight Technologies. KLA Instruments also offers a dedicated applications team within its global sales and support network.
The KLA Instruments comprehensive portfolio of products, software, analysis, services and expertise is designed to help scientists, researchers and engineers address their toughest measurement challenges by generating reliable, precise data. Through use of these products and services, they are better able to deliver the breakthroughs that impact their respective fields.
Learn more about KLA Instruments by visiting our website at www.kla-tencor.com/products/instruments, or contact us by email at [email protected].
KLA Corporation is the world's leading supplier of process control, yield management and metrology equipment for semiconductor fabrication facilities, research labs, and other industries. The company's comprehensive portfolio of products, software, analysis, services and expertise is designed to help scientists, researchers and engineers address their toughest measurement challenges by generating reliable, precise data. Through use of these products and services, they are better able to deliver the breakthroughs that impact their respective fields.
To support its growing global customer base, KLA maintains a significant presence throughout the United States, Europe and Asia, with local sales, applications, and customer support engineers.
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