Giám sát an toàn thời gian thực

Various types of semiconductor test will determine whether a chip is free of defects and meets the specification, but understanding how it’s behaving in the field under real workloads and harsh ambient conditions may be very different in automotive applications, where vibration, heat, cold can disrupt the normal functioning of a chip over time and reduce its lifespan. Alex Burlak, vice president of test and analytics at proteanTecs, explains how to measure a chip’s health during operation and throughout its lifecycle, how and when to take prescriptive action to bring it back into an acceptable operating range, and how data and analytics from sensors can be leveraged to understand the behavior of surrounding systems in real-time.

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Ed Sperling

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Ed Sperling is the editor in chief of Semiconductor Engineering.

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